X-밴드 레이더 산란계 자동 측정시스템 구축과 벼 생육 모니터링 (Construction of X-band automatic radar scatterometer measurement system and monitoring of rice growth)

서지정보

· 발행기관 : 한국토양비료학회
· 수록지 정보 : 한국토양비료학회지(Korean Journal of Soil Science and Fertilizer) / 43권 / 3호 / 374 ~ 383페이지
· 저자명 : 김이현, 홍석영, 이훈열

초록

Microwave radar can penetrate cloud cover regardless of weather conditions and can be used day and night. Especially a ground-based polarimetric scatterometer has advantages of monitoring crop conditions continuously with full polarization and different frequencies. Kim et al. (2009) have measured backscattering coefficients of paddy rice using L-, C-, X-band scatterometer system with full polarization and various angles during the rice growth period and have revealed the necessity of near-continuous automatic measurement to eliminate the difficulties, inaccuracy and sparseness of data acquisitions arising from manual operation of the system. In this study, we constructed an X-band automatic scatterometer system, analyzed scattering characteristics of paddy rice from X-band scatterometer data and estimated rice growth parameter using backscattering coefficients in X-band. The system was installed inside a shelter in an experimental paddy field at the National Academy of Agricultural Science (NAAS) before rice transplanting. The scatterometer system consists of X-band antennas, HP8720D vector network analyzer, RF cables and personal computer that controls frequency, polarization and data storage. This system using automatically measures fully-polarimetric backscattering coefficients of rice crop every 10 minutes. The backscattering coefficients were calculated from the measured data at a fixed incidence angle of 45° and with full polarization (HH, VV, HV, VH) by applying the radar equation and compared with rice growth data such as plant height, stem number, fresh dry weight and Leaf Area Index (LAI) that were collected at the same time of each rice growth parameter. We examined the temporal behaviour of the backscattering coefficients of the rice crop at X-band during rice growth period. The HH-, VV-polarization backscattering coefficients steadily increased toward panicle initiation stage, thereafter decreased and again increased in early-September. We analyzed the relationships between backscattering coefficients in X-band and plant parameters and predicted the rice growth parameters using backscattering coefficients. It was confirmed that X-band is sensitive to grain maturity at near harvesting season.

영어초록

Microwave radar can penetrate cloud cover regardless of weather conditions and can be used day and night. Especially a ground-based polarimetric scatterometer has advantages of monitoring crop conditions continuously with full polarization and different frequencies. Kim et al. (2009) have measured backscattering coefficients of paddy rice using L-, C-, X-band scatterometer system with full polarization and various angles during the rice growth period and have revealed the necessity of near-continuous automatic measurement to eliminate the difficulties, inaccuracy and sparseness of data acquisitions arising from manual operation of the system. In this study, we constructed an X-band automatic scatterometer system, analyzed scattering characteristics of paddy rice from X-band scatterometer data and estimated rice growth parameter using backscattering coefficients in X-band. The system was installed inside a shelter in an experimental paddy field at the National Academy of Agricultural Science (NAAS) before rice transplanting. The scatterometer system consists of X-band antennas, HP8720D vector network analyzer, RF cables and personal computer that controls frequency, polarization and data storage. This system using automatically measures fully-polarimetric backscattering coefficients of rice crop every 10 minutes. The backscattering coefficients were calculated from the measured data at a fixed incidence angle of 45° and with full polarization (HH, VV, HV, VH) by applying the radar equation and compared with rice growth data such as plant height, stem number, fresh dry weight and Leaf Area Index (LAI) that were collected at the same time of each rice growth parameter. We examined the temporal behaviour of the backscattering coefficients of the rice crop at X-band during rice growth period. The HH-, VV-polarization backscattering coefficients steadily increased toward panicle initiation stage, thereafter decreased and again increased in early-September. We analyzed the relationships between backscattering coefficients in X-band and plant parameters and predicted the rice growth parameters using backscattering coefficients. It was confirmed that X-band is sensitive to grain maturity at near harvesting season.

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